NANOCAD Trademark Information

Trademark by Applied Materials, Inc.

Diagnostic apparatus, namely, semiconductor wafer thickness gauges and operational software for the inspection, review, measurement and monitoring of semiconductor elements in the nature of wafers, reticles, and flat panel displays

Classification Information

Intent to Use Trademark - Applicant has not submitted proof of use in commerce the the USPTO.

Primary Class: Class Details:
Class (009)
Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
First Use Anywhere:: Not provided
First Use In Commerce: Not provided
General Information
Word mark: NANOCAD
Status/Status Date:
ABANDONED - NO STATEMENT OF USE FILED
8/31/2009
Serial Number: 76561361
Filing Date: 11/21/2003
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Diagnostic apparatus, namely, semiconductor wafer thickness gauges and operational software for the inspection, review, measurement and monitoring of semiconductor elements in the nature of wafers, reticles, and flat panel displays
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: 11/7/2006
Last Applicant/Owner:
Applied Materials, Inc.
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Mark Drawing Code: Standard Character Mark
Design Search:
(NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
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Current Status:
ABANDONED - NO STATEMENT OF USE FILED
8/31/2009
Correspondent Search:
Robert W. Mulcahy is a correspondent of NANOCAD trademark.
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