NANOFOCUS Trademark Information

Trademark by GE Sensing & Inspection Technologies GmbH

X-ray systems for non-destructive testing in science and industry, namely X-ray apparatus with image resolution in the micrometer and submicrometer or nanometer range, X-ray tubes with focal spots in the micrometer and submicrometer/nanometer range for non-destructive testing; image processing and control software for non-destructive testing with X-ray systems and X-ray tubes; image processing and control software for the X-ray analysis and in...

Roentgen systems for analysis and inspection of medical, biological and pathological preparations and specimen, namely X-ray apparatus with image resolution in the micrometer and submicrometer/nanometer range, X-ray tubes with focal spots in the micrometer and submicrometer/nanometer range for analysis and inspection of medical, biological and pathological preparations and specimen

Classification Information

Use in Commerce Trademark - Applicant has provided proof of use of this mark in commerce to USPTO.

Primary Class: Class Details:
Class (009)
Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
First Use Anywhere:: 9/17/2001
First Use In Commerce: 9/17/2001
Class (010)
Surgical, medical, dental, and veterinary apparatus and instruments, artificial limbs, eyes, and teeth; orthopedic articles; suture materials.
First Use Anywhere:: 9/17/2001
First Use In Commerce: 9/17/2001
General Information
Word mark: NANOFOCUS
Status/Status Date:
CONTINUED USE NOT FILED WITHIN GRACE PERIOD, UN-REVIVABLE
9/3/2014
Serial Number: 76440179
Filing Date: 8/14/2002
Registration Number: 2890499
Registration Date: 9/28/2004
Goods and Services: X-ray systems for non-destructive testing in science and industry, namely X-ray apparatus with image resolution in the micrometer and submicrometer or nanometer range, X-ray tubes with focal spots in the micrometer and submicrometer/nanometer range for non-destructive testing; image processing and control software for non-destructive testing with X-ray systems and X-ray tubes; image processing and control software for the X-ray analysis and inspection of medical, biological and pathological preparations and specimen
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: N/A
Last Applicant/Owner:
GE Sensing & Inspection Technologies GmbH
HURTH 50354
Mark Drawing Code: Typeset (Words/letter/Number)
Design Search:
(NO DATA)
Register Type: Supplemental
Disclaimer: (NOT AVAILABLE)
Correspondent:
General Electric Company
Corporate Trademark Operations
3135 Easton Turnpike
Fairfield CT 06828
Current Status:
CONTINUED USE NOT FILED WITHIN GRACE PERIOD, UN-REVIVABLE
9/3/2014
Correspondent Search:
Catherine Mennenga is a correspondent of NANOFOCUS trademark.
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