NFDM-3500 Trademark Information

Trademark by Nikon Corporation

Semiconductor testing apparatus; Semiconductor wafer testing apparatus

Classification Information

Intent to Use Trademark - Applicant has not submitted proof of use in commerce the the USPTO.

Primary Class: Class Details:
Class (009)
Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
First Use Anywhere:: 12/16/2014
First Use In Commerce: 12/16/2014
General Information
Word mark: NFDM-3500
Status/Status Date:
ABANDONED - FAILURE TO RESPOND OR LATE RESPONSE
8/17/2016
Serial Number: 86441699
Filing Date: 10/31/2014
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Semiconductor testing apparatus; Semiconductor wafer testing apparatus
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: 4/7/2015
Last Applicant/Owner:
Nikon Corporation
Tokyo 108-6290
Mark Drawing Code: Standard Character Mark
Design Search:
(NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
BARCLAY DAMON, LLP
1270 AVENUE OF THE AMERICAS STE 600
NEW YORK NY 10020-1704
Current Status:
ABANDONED - FAILURE TO RESPOND OR LATE RESPONSE
8/17/2016
Correspondent Search:
JASON S. NARDIELLO is a correspondent of NFDM-3500 trademark.
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