OPENSHORT Trademark Information

Trademark by Elite Semiconductor Inc.

Computer programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; Computer programs and computer software for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; data processing programs for detectin...

Classification Information

Use in Commerce Trademark - Applicant has provided proof of use of this mark in commerce to USPTO.

Primary Class: Class Details:
Class (009)
Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
First Use Anywhere:: 7/26/2018
First Use In Commerce: 1/14/2019
General Information
Word mark: OPENSHORT
Status/Status Date:
REGISTERED
5/7/2019
Serial Number: 87917601
Filing Date: 5/11/2018
Registration Number: 5747764
Registration Date: 5/7/2019
Goods and Services: Computer programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; Computer programs and computer software for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; data processing programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes
Mark Description: The mark consists of the stylized word "OPENSHORT".
Type Of Mark: TradeMark
Published For Opposition Date: N/A
Last Applicant/Owner:
Elite Semiconductor Inc.
********
********
***** ****
Mark Drawing Code: Drawing with Words in Stylized form
Design Search:
(NO DATA)
Register Type: Supplemental
Disclaimer: (NOT AVAILABLE)
Correspondent:
********
********
***** ****
Current Status:
REGISTERED
5/7/2019
Correspondent Search:
JOE MCKINNEY MUNCY is a correspondent of OPENSHORT trademark.
Current Overall Rating:
RatingRatingRatingRatingRating

(0 review)

As seen on